Fault-avoidance C-element based low overhead and TNU-resilient latch. - Zhengfeng Huang; Zhouyu Gong; Dongxing Ma; Xiaolei Wang; Yingchun Lu; Wenfa Zhan; Huaguo Liang; Tianming Ni (Microelectron. J., 2023)

Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. - Zhengfeng Huang; Hao Wang 169; Dongxing Ma; Huaguo Liang; Yiming Ouyang; Aibin Yan (J. Electron. Test., 2023)

Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. - Zhengfeng Huang; Dongxing Ma; Runwu Ji; Huaguo Liang; Aibin Yan; Tai Song; Tianming Ni (IEEE Trans. Aerosp. Electron. Syst., 2023)