Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. - Dora A. Chaparro-Ortiz; Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Guevara; P. Srinivasan 002; Fernando Guarin (IRPS, 2023)

Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. - Alan Y. Otero-Carrascal; Dora A. Chaparro-Ortiz; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002 (IRPS, 2024)