A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. - Guenther Benstetter; Michael W. Ruprecht; Douglas B. Hunt (Microelectron. Reliab., 2002)

A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. - Michael W. Ruprecht; Guenther Benstetter; Douglas B. Hunt (Microelectron. Reliab., 2003)