Influence of test techniques on soft breakdown detection in ultra-thin oxides. - Douglas Brisbin; Prasad Chaparala (Microelectron. Reliab., 2002)

Optimizing the hot carrier reliability of N-LDMOS transistor arrays. - Douglas Brisbin; Andy Strachan; Prasad Chaparala (Microelectron. Reliab., 2005)

Impact of NBTI and HCI on PMOSFET threshold voltage drift. - Prasad Chaparala; Douglas Brisbin (Microelectron. Reliab., 2005)