Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. - Thomas Bartenstein; Douglas Heaberlin; Leendert M. Huisman; David Sliwinski (ITC, 2001)

Application of non-parametric statistics of the parametric response for defect diagnosis. - Rama Gudavalli; W. Robert Daasch; Phil Nigh; Douglas Heaberlin (ITC, 2009)