Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. - Dhamin Al-Khalili; Saman Adham; Côme Rozon; Moazzem Hossain; Douglas Racz (DFT, 1998)

Comparing defect coverage for current-mode logic and CMOS VLSI cells. - Côme Rozon; Dhamin Al-Khalili; Saman Adham; Douglas Racz (ICECS, 2000)

Comprehensive defect analysis and testability of current-mode logic circuits. - Saman Adham; Dhamin Al-Khalili; Côme Rozon; Douglas Racz (ISCAS, 2000)