In-Circuit Testability Factors: Shoot With a Rifle. - Douglas W. Raymond (ITC, 1984)

Non-Volatile Programmable Devices and In-Circuit Test. - Douglas W. Raymond; Dominic F. Haigh; Ray Bodick; Barbara Ryan; Dale McCombs (ITC, 1994)

Goal-Directed Vector Generation Using Sample ICs. - Douglas W. Raymond; Philip J. Stringer; Harold W. Ng; Michael Mitsumata; Robert Burk (ITC, 1994)

Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs. - Douglas W. Raymond; D. Eugene Wedge; Philip J. Stringer; Harold W. Ng; Suzanne T. Jennings; Craig T. Pynn; Winsor Soule Jr. (ITC, 1995)

Finding Opens with Optics. - Douglas W. Raymond (ITC, 1997)

Why Automate Optical Inspection? - Douglas W. Raymond; Dominic F. Haigh (ITC, 1997)