A Study of Outlier Analysis Techniques for Delay Testing. - Sean H. Wu; Dragoljub Gagi Drmanac; Li-C. Wang (ITC, 2008)

Predicting variability in nanoscale lithography processes. - Dragoljub Gagi Drmanac; Frank Liu 001; Li-C. Wang (DAC, 2009)

Minimizing outlier delay test cost in the presence of systematic variability. - Dragoljub Gagi Drmanac; Brendon Bolin; Li-C. Wang; Magdy S. Abadir (ITC, 2009)

Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. - Nicholas Callegari; Dragoljub Gagi Drmanac; Li-C. Wang; Magdy S. Abadir (DAC, 2010)

Online selection of effective functional test programs based on novelty detection. - Po-Hsien Chang; Dragoljub Gagi Drmanac; Li-C. Wang (ICCAD, 2010)

A non-parametric approach to behavioral device modeling. - Dragoljub Gagi Drmanac; Brendon Bolin; Li-C. Wang (ISQED, 2010)

Mining AC delay measurements for understanding speed-limiting paths. - Janine Chen; Brendon Bolin; Li-C. Wang; Jing Zeng; Dragoljub Gagi Drmanac; Michael Mateja (ITC, 2010)

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. - Dragoljub Gagi Drmanac; Nik Sumikawa; LeRoy Winemberg; Li-C. Wang; Magdy S. Abadir (DATE, 2011)

Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. - Dragoljub Gagi Drmanac; Michael Laisne (ITC, 2011)

Forward prediction based on wafer sort data - A case study. - Nik Sumikawa; Dragoljub Gagi Drmanac; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (ITC, 2011)

Understanding customer returns from a test perspective. - Nik Sumikawa; Dragoljub Gagi Drmanac; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (VTS, 2011)

Innovative practices session 5C: Machine learning and data analysis in test. - Sounil Biswas; John M. Carulli; Dragoljub Gagi Drmanac; Arpan Bhattacherjee (VTS, 2014)