A fast histogram-clustering approach for multi-level thresholding. - Du-Ming Tsai; Ying-Hsiung Chen (Pattern Recognit. Lett., 1992)

Curve fitting approach for tangent angle and curvature measurements. - Du-Ming Tsai; Ming-fong Chen (Pattern Recognit., 1994)

A three-dimensional machine-vision approach for automatic robot programming. - Du-Ming Tsai (J. Intell. Robotic Syst., 1995)

A fast thresholding selection procedure for multimodal and unimodal histograms. - Du-Ming Tsai (Pattern Recognit. Lett., 1995)

Object recognition by a linear weight classifier. - Du-Ming Tsai; Ming-fong Chen (Pattern Recognit. Lett., 1995)

Use neural networks to determine matching order for recognizing overlapping objects. - Du-Ming Tsai; Tsai Ray-Yuan (Pattern Recognit. Lett., 1996)

An improved generalized Hough transform for the recognition of overlapping objects. - Du-Ming Tsai (Image Vis. Comput., 1997)

Boundary-based corner detection using neural networks. - Du-Ming Tsai (Pattern Recognit., 1997)

A moment-preserving approach for depth from defocus. - Du-Ming Tsai; Chin-Tun Lin (Pattern Recognit., 1998)

Segmenting focused objects in complex visual images. - Du-Ming Tsai; Hu-Jong Wang (Pattern Recognit. Lett., 1998)

Automated surface inspection for directional textures. - Du-Ming Tsai; C.-Y. Hsieh (Image Vis. Comput., 1999)

Surface roughness classification for castings. - Du-Ming Tsai; Chi-Fong Tseng (Pattern Recognit., 1999)

A stochastic optimization approach for roundness measurement. - Mu-Chen Chen; Du-Ming Tsai; Hsien-Yu Tseng (Pattern Recognit. Lett., 1999)

Boundary-based corner detection using eigenvalues of covariance matrices. - Du-Ming Tsai; Huei-Tse Hou; H.-J. Su (Pattern Recognit. Lett., 1999)

Optimal Gabor filter design for texture segmentation using stochastic optimization. - Du-Ming Tsai; Song-Kuaw Wu; Mu-Chen Chen (Image Vis. Comput., 2001)

Automatic surface inspection using wavelet reconstruction. - Du-Ming Tsai; Bo Hsiao (Pattern Recognit., 2001)

Rotation-invariant pattern matching with color ring-projection. - Du-Ming Tsai; Ya-Hui Tsai (Pattern Recognit., 2002)

Rotation-invariant pattern matching using wavelet decomposition. - Du-Ming Tsai; Cheng-Huei Chiang (Pattern Recognit. Lett., 2002)

Automatic band selection for wavelet reconstruction in the application of defect detection. - Du-Ming Tsai; Cheng-Huei Chiang (Image Vis. Comput., 2003)

Automated surface inspection for statistical textures. - Du-Ming Tsai; Tse-Yun Huang (Image Vis. Comput., 2003)

Defect detection in textured surfaces using color ring-projection correlation. - Du-Ming Tsai; Ya-Hui Tsai (Mach. Vis. Appl., 2003)

Fast normalized cross correlation for defect detection. - Du-Ming Tsai; Chien-Ta Lin (Pattern Recognit. Lett., 2003)

The evaluation of normalized cross correlations for defect detection. - Du-Ming Tsai; Chien-Ta Lin; Jeng-Fung Chen (Pattern Recognit. Lett., 2003)

An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures. - Du-Ming Tsai; Shin-Min Chao (Image Vis. Comput., 2005)

An eigenvalue-based similarity measure and its application in defect detection. - Du-Ming Tsai; Ron-Hwa Yang (Image Vis. Comput., 2005)

A quantile-quantile plot based pattern matching for defect detection. - Du-Ming Tsai; Cheng-Hsiang Yang (Pattern Recognit. Lett., 2005)

Optimal multi-thresholding using a hybrid optimization approach. - Erwie Zahara; Shu-Kai S. Fan; Du-Ming Tsai (Pattern Recognit. Lett., 2005)

Defect detection in low-contrast glass substrates using anisotropic diffusion. - Shin-Min Chao; Du-Ming Tsai; Yan-Hsin Tseng; Yuan-Ruei Jhang (ICPR (1), 2006)

Independent component analysis based filter design for defect detection in low-contrast textured images. - Du-Ming Tsai; Yan-Hsin Tseng; Shin-Min Chao; Chao-Hsuan Yen (ICPR (2), 2006)

An independent component analysis-based filter design for defect detection in low-contrast surface images. - Du-Ming Tsai; Ping-Chieh Lin; Chi-Jie Lu (Pattern Recognit., 2006)

Astronomical image restoration using an improved anisotropic diffusion. - Shin-Min Chao; Du-Ming Tsai (Pattern Recognit. Lett., 2006)

Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction. - Du-Ming Tsai; Chih-Chia Kuo (Mach. Vis. Appl., 2007)

An anisotropic diffusion-based defect detection for low-contrast glass substrates. - Shin-Min Chao; Du-Ming Tsai (Image Vis. Comput., 2008)

Independent component analysis-based defect detection in patterned liquid crystal display surfaces. - Chi-Jie Lu; Du-Ming Tsai (Image Vis. Comput., 2008)

Defect detection in periodically patterned surfaces using independent component analysis. - Du-Ming Tsai; Shia-Chih Lai (Pattern Recognit., 2008)

Motion detection using Fourier image reconstruction. - Du-Ming Tsai; Wei-Yao Chiu (Pattern Recognit. Lett., 2008)

1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. - Du-Ming Tsai; Su-Ta Chuang (Mach. Vis. Appl., 2009)

Independent Component Analysis-Based Background Subtraction for Indoor Surveillance. - Du-Ming Tsai; Shia-Chih Lai (IEEE Trans. Image Process., 2009)

Anisotropic diffusion-based detail-preserving smoothing for image restoration. - Shin-Min Chao; Du-Ming Tsai; Wei-Yao Chiu; Wei-Chen Li (ICIP, 2010)

A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces. - Shin-Min Chao; Du-Ming Tsai; Wei-Chen Li; Wei-Yao Chiu (ICPR, 2010)

A Macro-observation Approach of Intelligence Video Surveillance for Real-Time Unusual Event Detection. - Du-Ming Tsai; Wei-Yao Chiu (UIC/ATC Workshops, 2010)

A Macro-Observation Scheme for Abnormal Event Detection in Daily-Life Video Sequences. - Wei-Yao Chiu; Du-Ming Tsai (EURASIP J. Adv. Signal Process., 2010)

Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion. - Du-Ming Tsai; Chih-Chieh Chang; Shin-Min Chao (Image Vis. Comput., 2010)

Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images. - Shin-Min Chao; Du-Ming Tsai (Pattern Recognit., 2010)

Defect detection of uneven brightness in low-contrast images using basis image representation. - Yan-Hsin Tseng; Du-Ming Tsai (Pattern Recognit., 2010)

An improved anisotropic diffusion model for detail- and edge-preserving smoothing. - Shin-Min Chao; Du-Ming Tsai (Pattern Recognit. Lett., 2010)

Surface defect detection of 3D objects using robot vision. - Ya-Hui Tsai; Du-Ming Tsai; Wei-Chen Li; Wei-Yao Chiu; Ming-Chin Lin (Ind. Robot, 2011)

Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis. - Du-Ming Tsai; Hsin-Yang Tsai (Mach. Vis. Appl., 2011)

Fuzzy C-means based clustering for linearly and nonlinearly separable data. - Du-Ming Tsai; Chung-Chan Lin (Pattern Recognit., 2011)

Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection. - Wei-Chen Li; Du-Ming Tsai (IEEE Trans. Ind. Informatics, 2011)

Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces. - Du-Ming Tsai; Jie-Yu Luo (IEEE Trans. Ind. Informatics, 2011)

ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds. - Wei-Yao Chiu; Du-Ming Tsai (GRAPP/IVAPP, 2012)

A fast regularity measure for surface defect detection. - Du-Ming Tsai; Ming-Chun Chen; Wei-Chen Li; Wei-Yao Chiu (Mach. Vis. Appl., 2012)

Wavelet-based defect detection in solar wafer images with inhomogeneous texture. - Wei-Chen Li; Du-Ming Tsai (Pattern Recognit., 2012)

A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection. - Du-Ming Tsai; I-Yung Chiang; Ya-Hui Tsai (IEEE Trans. Ind. Informatics, 2012)

A real-time ICA-based activity recognition in video sequences. - Du-Ming Tsai; Wei-Yao Chiu (MVA, 2013)

A template reconstruction scheme for moving object detection from a mobile robot. - Du-Ming Tsai; Tzu-Hsun Tseng (Ind. Robot, 2013)

Defect Detection in Solar Modules Using ICA Basis Images. - Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu (IEEE Trans. Ind. Informatics, 2013)

3-D vision-assist guidance for robots or the visually impaired. - Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu (Ind. Robot, 2014)

Dual-mode detection for foreground segmentation in low-contrast video images. - Wei-Yao Chiu; Du-Ming Tsai (J. Real Time Image Process., 2014)

Moving object detection from a mobile robot using basis image matching. - Du-Ming Tsai; Wei-Yao Chiu; Tzu-Hsun Tseng (Intelligent Robots and Computer Vision: Algorithms and Techniques, 2015)

Surface defect detection in low-contrast images using basis image representation. - Du-Ming Tsai; Yan-Hsin Tseng; Wei-Yao Chiu (MVA, 2015)

Defect detection in multi-crystal solar cells using clustering with uniformity measures. - Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu (Adv. Eng. Informatics, 2015)

Optical flow-motion history image (OF-MHI) for action recognition. - Du-Ming Tsai; Wei-Yao Chiu; Men-Han Lee (Signal Image Video Process., 2015)

Coffee plantation area recognition in satellite images using Fourier transform. - Du-Ming Tsai; Wan-Ling Chen (Comput. Electron. Agric., 2017)

Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique. - Du-Ming Tsai; Yi-Chun Hsieh (IEEE Trans. Instrum. Meas., 2017)

Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification. - Du-Ming Tsai; Morris S. K. Fan; Yi-Quan Huang; Wei-Yao Chiu (VISIGRAPP (5: VISAPP), 2019)

Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. - Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Fei He; Chun-Chung Cheng (IEEE Trans Autom. Sci. Eng., 2020)

Fast and Precise Positioning in PCBs Using Deep Neural Network Regression. - Du-Ming Tsai; Yi-Hsiang Chou (IEEE Trans. Instrum. Meas., 2020)

Autoencoder-based anomaly detection for surface defect inspection. - Du-Ming Tsai; Po-Hao Jen (Adv. Eng. Informatics, 2021)

Auto-Annotated Deep Segmentation for Surface Defect Detection. - Du-Ming Tsai; Shu-Kai S. Fan; Yi-Hsiang Chou (IEEE Trans. Instrum. Meas., 2021)

Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes. - Shu-Kai S. Fan; Chun-Wei Cheng; Du-Ming Tsai (IEEE Trans Autom. Sci. Eng., 2022)

Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing. - Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Mabel C. Chou; Chih-Hung Jen; Jen-Hsuan Tsou (IEEE Trans Autom. Sci. Eng., 2022)

Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks. - Carlos Solorzano; Du-Ming Tsai (IEEE Trans Autom. Sci. Eng., 2024)