Towards Zero Bit-Error-Rate Physical Unclonable Function: Mismatch-Based vs. Physical-Based Approaches in Standard CMOS Technology. - Duhyun Jeon; Jong-Hak Baek; Dong Kyue Kim; Byong-Deok Choi (DSD, 2015)

A Physical Unclonable Function With Bit Error Rate × 10-8 Based on Contact Formation Probability Without Error Correction Code. - Duhyun Jeon; Jong-Hak Baek; Yong-Duck Kim; Jaeseong Lee 005; Dong Kyue Kim; Byong-Deok Choi (IEEE J. Solid State Circuits, 2020)

Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. - Duhyun Jeon; Dongmin Lee; Dong Kyue Kim; Byong-Deok Choi (HOST, 2022)

A 325F2 Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio. - Duhyun Jeon; Dongmin Lee; Dong Kyue Kim; Byong-Deok Choi (IEEE J. Solid State Circuits, 2023)

Virtual Private Network (VPN) with Post-Quantum Cryptography (PQC). - Hyoungsub Shim; Bongho Kang; Haejung Im; Duhyun Jeon; Seok-Min Kim (ICTC, 2024)

qTrustNet Virtual Private Network (VPN): Enhancing Security in the Quantum Era. - Hyoungsub Shim; Bongho Kang; Haejung Im; Duhyun Jeon; Seok-Min Kim (IEEE Access, 2025)