Diagnosing Transition Delay Faults under Scan-Based Logic Array. - Duo-Yao Kang; Shiou-Ning Lin; Kuen-Jong Lee (ITC-Asia, 2022)

Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks. - Yan-Fu Chen; Duo-Yao Kang; Kuen-Jong Lee (ITC, 2022)