Effect of Radiation on Interface Traps of SOI NMOSFETs by the Direct-Current Current-Voltage Technique. - Yangyang Li; Xiaojing Li; Bo Li; Linchun Gao; Weiwei Yan; Fangfang Wang; Duoli Li; Chuanbin Zeng; Jiajun Luo; Zhengsheng Han (IEEE Access, 2019)

Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET. - Xinyi Zhang; Kewei Wang 007; Fang Wang; Jiangjiang Li; Zhicheng Wu; Duoli Li; Bo Li; Jianhui Bu; Zhengsheng Han (IRPS, 2023)

Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset. - Zhan Zheyu; Hainan Liu; Duoli Li; Ma Quangang; Wenxin Zhao; Zhenzhen Yan; Bo Li 051 (IEEE Trans. Circuits Syst. II Express Briefs, 2025)