Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests. - Jianlin Huang; Dusan S. Golubovic; Sau Koh; Dao-Guo Yang; Xiupeng Li; Xuejun Fan; G. Q. Zhang (Microelectron. Reliab., 2015)

Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test. - Jianlin Huang; Dusan S. Golubovic; Sau Koh; Dao-Guo Yang; Xiupeng Li; Xuejun Fan; G. Q. Zhang (Reliab. Eng. Syst. Saf., 2016)