PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks. - Seokjun Jang; Youngki Moon; Duyeon Won; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)

A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM. - Youngki Moon; Seung Ho Shin; Seokjun Jang; Duyeon Won; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2025)