ScanBIST: A Multi-frequency Scan-based BIST Method. - Benoit Nadeau-Dostie; Dwayne Burek; Abu S. M. Hassan (ITC, 1992)

ScanBist: A Multifrequency Scan-Based BIST Method. - Benoit Nadeau-Dostie; Dwayne Burek; Abu S. M. Hassan (IEEE Des. Test Comput., 1994)

IP and Automation to Support IEEE P1500. - Dwayne Burek; Garen Darbinyan; Rohit Kapur; Maurice Lousberg; Teresa L. McLaurin; Mike Ricchetti (VTS, 2001)

Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. - Kazuhiko Iijima; Armagan Akar; Charlie McDonald; Dwayne Burek (Asian Test Symposium, 2002)

An Integrated Memory Self Test and EDA Solution. - R. Dean Adams; Robert Abbott; Xiaoliang Bai; Dwayne Burek; Eric MacDonald (MTDT, 2004)

OCI: Open Compression Interface. - Bruce Cory; Rohit Kapur; Mick Tegethoff; Mark Kassab; Brion L. Keller; Kee Sup Kim; Dwayne Burek; Steven F. Oakland; Benoit Nadeau-Dostie (ITC, 2006)