Quantification and Prediction of Damage in SAM Images of Semiconductor Devices. - Dzenana Alagic; Olivia Bluder; Jürgen Pilz (ICIAR, 2018)

Unsupervised Algorithm to Detect Damage Patterns in Microstructure Images of Metal Films. - Dzenana Alagic; Jürgen Pilz (IPAS, 2018)