Statistical aspects of the degradation of LDD nMOSFETs. - E. Andries; R. Dreesen; Kris Croes; Ward De Ceuninck; Luc De Schepper; Guido Groeseneken; K. F. Lo; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2002)

High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)