Study of the ESD defects impact on ICs reliability. - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

High performance electronics in long lifetime, continuous operation, industrial products: The art of balancing conflicting interests. - C. Banc; J. Guinet; E. Doche (Microelectron. Reliab., 2012)