Do Stuck Fault Models Reflect Manufacturing Defects? - C. C. Beh; K. H. Arya; Charles E. Radke; E. Kofi Vida-Torku (ITC, 1982)

Petri Net based search directing heuristics for test generation. - E. Kofi Vida-Torku; Beverly Messick Huey (DAC, 1983)

Quality level and fault coverage for multichip modules. - E. Kofi Vida-Torku; Charles E. Radke (DAC, 1983)

Performance Assurance of Memories Embedded in VLSI Chips. - E. Kofi Vida-Torku; James A. Monzel; Charles E. Radke (ITC, 1986)

Impact of Boundary Scan Design on Delay Test. - E. Kofi Vida-Torku (ITC, 1992)

Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603TM Microprocessor. - Craig Hunter; E. Kofi Vida-Torku; Johnny J. LeBlanc (ITC, 1994)

Design and test of the PowerPC 603 microprocessor. - E. Kofi Vida-Torku; Charles H. Malley; Sung Park; R. Reed (ED&TC, 1995)

Designing for scan test of high performance embedded memories. - E. Kofi Vida-Torku; George Joos (ITC, 1998)