Experimental evaluation of hot electron reliability on differential Clapp-VCO. - S. L. Jang; Jiann-Shiun Yuan; S. D. Yen; E. Kritchanchai; G. W. Huang (Microelectron. Reliab., 2013)

Power amplifier resilient design for process, voltage, and temperature variations. - J. S. Yuan; E. Kritchanchai (Microelectron. Reliab., 2013)