Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. - Alain Michez; Jerome Boch; S. Dhombres; Frédéric Saigné; Antoine D. Touboul; J.-R. Vaillé; Laurent Dusseau; E. Lorfèvre; R. Ecoffet (Microelectron. Reliab., 2013)