Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. - Alain Bravaix; M. Saliva; Florian Cacho; X. Federspiel; Cheikh Ndiaye; Souhir Mhira; Edith Kussener; E. Pauly; Vincent Huard (IOLTS, 2016)