Electro-thermal modeling of multifinger AlGaN/GaN HEMT device operation including thermal substrate effects. - E. R. Heller; A. Crespo (Microelectron. Reliab., 2008)

Performance of commercial foundry-level AlGaN/GaN HEMTs after hot electron stressing. - Brian S. Poling; J. L. Brown; E. R. Heller; B. Stumpff; J. A. Beckman; A. M. Hilton (Microelectron. Reliab., 2015)

Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps. - A. Sasikumar; Aaron R. Arehart; Glen David Via; B. Winningham; Brian S. Poling; E. R. Heller; S. A. Ringel (Microelectron. Reliab., 2015)

Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN. - Aaron R. Arehart; A. Sasikumar; Glen David Via; Brian S. Poling; E. R. Heller; S. A. Ringel (Microelectron. Reliab., 2016)