Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs. - Alain Bravaix; Didier Goguenheim; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2001)

Failures in ultrathin oxides: Stored energy or carrier energy driven? - S. Bruyère; Frederic Monsieur; David Roy 001; E. Vincent; Gérard Ghibaudo (Microelectron. Reliab., 2001)

Body effect induced wear-out acceleration in ultra-thin oxides. - Sylvie Bruyère; David Roy 001; E. Robilliart; E. Vincent; Gérard Ghibaudo (Microelectron. Reliab., 2001)

Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides. - Frederic Monsieur; E. Vincent; G. Pananakakis; Gérard Ghibaudo (Microelectron. Reliab., 2001)

Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions. - Frederic Monsieur; E. Vincent; David Roy 001; S. Bruyère; G. Pananakakis; Gérard Ghibaudo (Microelectron. Reliab., 2001)

Gate oxide Reliability assessment optimization. - Frederic Monsieur; E. Vincent; David Roy 001; S. Bruyère; G. Pananakakis; Gérard Ghibaudo (Microelectron. Reliab., 2002)

Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement. - David Roy 001; S. Bruyère; E. Vincent; Frederic Monsieur (Microelectron. Reliab., 2002)

MIM capacitance variation under electrical stress. - C. Besset; S. Bruyère; S. Blonkowski; S. Crémer; E. Vincent (Microelectron. Reliab., 2003)

Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. - Alain Bravaix; C. Trapes; Didier Goguenheim; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2003)

Guest Editorial. - Gérard Ghibaudo; E. Vincent (Microelectron. Reliab., 2003)

On the role of holes in oxide breakdown mechanism in inverted nMOSFETs. - Frederic Monsieur; E. Vincent; Vincent Huard; S. Bruyère; David Roy 001; Thomas Skotnicki; G. Pananakakis; Gérard Ghibaudo (Microelectron. Reliab., 2003)

Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides. - Alain Bravaix; Didier Goguenheim; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2004)

Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs. - Alain Bravaix; Didier Goguenheim; Mickael Denais; Vincent Huard; C. R. Parthasarathy; F. Perrier; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2005)

A thorough investigation of MOSFETs NBTI degradation. - Vincent Huard; Mickael Denais; F. Perrier; Nathalie Revil; C. R. Parthasarathy; Alain Bravaix; E. Vincent (Microelectron. Reliab., 2005)

Designing in reliability in advanced CMOS technologies. - C. R. Parthasarathy; Mickael Denais; Vincent Huard; G. Ribes; David Roy 001; Chloe Guérin; F. Perrier; E. Vincent; Alain Bravaix (Microelectron. Reliab., 2006)

Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements. - G. Néau; Frédéric Martinez; M. Valenza; J. C. Vildeuil; E. Vincent; Frédéric Boeuf; F. Payet; K. Rochereau (Microelectron. Reliab., 2007)

Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation. - L. Gerrer; M. Rafik; G. Ribes; Gérard Ghibaudo; E. Vincent (Microelectron. Reliab., 2010)

Performance & reliability of 3D architectures (πfet, Finfet, Ωfet). - Antoine Laurent; Xavier Garros; Sylvain Barraud; J. Pelloux-Prayer; Mikaël Cassé; Fred Gaillard; X. Federspiel; David Roy 001; E. Vincent; Gérard Ghibaudo (IRPS, 2018)

Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors. - Xavier Garros; Antoine Laurent; Alexandre Subirats; X. Federspiel; E. Vincent; Gilles Reimbold (Microelectron. Reliab., 2018)

BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. - Louis Gerrer; Jacques Cluzel; Fred Gaillard; Xavier Garros; Xavier Federspiel; Florian Cacho; David Roy 001; E. Vincent (IRPS, 2021)