Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. - Yoon-Jong Song; Heung-Jin Joo; Seung-Kuk Kang; Hyun-Ho Kim; Jung-Hoon Park; Y. M. Kang; E. Y. Kang; Sung-Young Lee; Kinam Kim (Microelectron. Reliab., 2005)