Hot-carrier degradation analysis based on ring oscillators. - Jingchao Wang; Edgar Olthof; Wim Metselaar (Microelectron. Reliab., 2006)

Moisture diffusion rate in an ultra-low-k dielectric and its effect on the dielectric reliability. - Ning Duan; Vignesh Subramanian; Edgar Olthof; Paul Eggenkamp; Michiel van Soestbergen; Richard Braspenning (IRPS, 2021)