Proper Name Classification in an Information Extraction Toolset. - Peter Wallis; Edmund Yuen; Greg Chase (CoNLL, 1998)

Evaluation of the machine learning classifier in wafer defects classification. - Jessnor Arif Mat-Jizat; Anwar P. P. Abdul Majeed; Ahmad Fakhri Ab. Nasir; Zahari Taha; Edmund Yuen (ICT Express, 2021)

The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. - Lim Shi Xuen; Ismail Mohd Khairuddin; Mohd Azraai Mohd Razman; Jessnor Arif Mat-Jizat; Edmund Yuen; Haochuan Jiang; Eng Hwa Yap; Anwar P. P. Abdul Majeed (RiTA, 2022)