Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. - Josep Altet; Diego Mateo; José Luis González 001; Eduardo Aldrete-Vidrio (ISCAS, 2006)

Electrical characterization of analogue and RF integrated circuits by thermal measurements. - Diego Mateo; Josep Altet; Eduardo Aldrete-Vidrio (Microelectron. J., 2007)

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. - Eduardo Aldrete-Vidrio; M. Amine Salhi; Josep Altet; Stéphane Grauby; Diego Mateo; H. Michel; L. Clerjaud; Jean-Michel Rampnoux; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire (ETS, 2008)

Non-invasive RF built-in testing using on-chip temperature sensors. - Eduardo Aldrete-Vidrio; Marvin Onabajo; Josep Altet; Diego Mateo; José Silva-Martínez (ITC, 2009)

Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. - Josep Altet; Diego Mateo; Eduardo Aldrete-Vidrio (IOLTS, 2010)

Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. - Marvin Onabajo; Didac Gómez; Eduardo Aldrete-Vidrio; Josep Altet; Diego Mateo; José Silva-Martínez (J. Electron. Test., 2011)

Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. - Marvin Onabajo; Josep Altet; Eduardo Aldrete-Vidrio; Diego Mateo; José Silva-Martínez (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. - Josep Altet; Eduardo Aldrete-Vidrio; Ferran Reverter; Didac Gómez; José Luis González 001; Marvin Onabajo; José Silva-Martínez; B. Martineau; X. Perpiñà; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Xavier Aragonès; et al. (MWSCAS, 2014)