Evaluation of AlGaInP LEDs reliability based on accelerated tests. - Eduardo Nogueira; Manuel Vázquez; Neftalí Núñez (Microelectron. Reliab., 2009)

Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests. - Manuel Vázquez; Neftalí Núñez; Eduardo Nogueira; A. Borreguero (Microelectron. Reliab., 2010)

Accelerated life test of high luminosity AlGaInP LEDs. - Eduardo Nogueira; Manuel Vázquez; J. Mateos (Microelectron. Reliab., 2012)

Accelerated Life Test of high luminosity blue LEDs. - Eduardo Nogueira; Vincenzo Orlando; Javier Ochoa; Antonio Fernandez; Manuel Vázquez (Microelectron. Reliab., 2016)

Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements. - Eduardo Nogueira; Juan Sancho Gil; José-Luis Sánchez-Bote (Microelectron. Reliab., 2018)

Predictive Fraud Detection: An Intelligent Method for Internet of Smart Grid Things Systems. - Lucas Bastos; Bruno S. Martins; Hugo Santos; Iago Medeiros; Paulo Eugênio; Leonardo B. Marques; Denis Rosário; Eduardo Nogueira; Eduardo Cerqueira; Márcio Eduardo Kreutz; Augusto Neto 001 (J. Internet Serv. Appl., 2023)

Analysis of Electrical Signals by Machine Learning for Classification of Individualized Electronics on the Internet of Smart Grid Things (IoSGT) architecture. - Leonardo B. Marques; Paulo Eugênio; Lucas Bastos; Hugo Santos; Denis Rosário; Eduardo Nogueira; Eduardo Cerqueira; Márcio Eduardo Kreutz; Augusto Neto 001 (J. Internet Serv. Appl., 2023)