An Improved Method for Identifying Linear Dependencies in Path Delay Faults. - Edward Flanigan; Themistoklis Haniotakis; Spyros Tragoudas (ISQED, 2006)

Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture. - Rajsekhar Adapa; Edward Flanigan; Spyros Tragoudas; Michael Laisne; Hailong Cui; Tsvetomir Petrov (ISQED, 2007)

Enhanced Identification of Strong Robustly Testable Paths. - Edward Flanigan; Spyros Tragoudas (ISQED, 2007)

Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture. - Edward Flanigan; Rajsekhar Adapa; Hailong Cui; Michael Laisne; Spyros Tragoudas; Tsvetomir Petrov (VLSI Design, 2007)

A Novel Test Generation Methodology for Adaptive Diagnosis. - Rajsekhar Adapa; Edward Flanigan; Spyros Tragoudas (ISQED, 2008)

Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures. - Edward Flanigan; Arkan Abdulrahman; Spyros Tragoudas (ISQED, 2008)

Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model. - Dheepakkumaran Jayaraman; Edward Flanigan; Spyros Tragoudas (ITC, 2008)

Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions. - Edward Flanigan; Spyros Tragoudas; Arkan Abdulrahman (VTS, 2009)

Identification of Delay Measurable PDFs Using Linear Dependency Relationships. - Edward Flanigan; Spyros Tragoudas (IEEE Trans. Very Large Scale Integr. Syst., 2010)