Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. - Edward Namkyu Cho; Jung Han Kang; Ilgu Yun (Microelectron. Reliab., 2011)

Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm. - Edward Namkyu Cho; Pyung Moon; Chang Eun Kim; Ilgu Yun (Expert Syst. Appl., 2012)

Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors. - Suehye Park; Edward Namkyu Cho; Ilgu Yun (Microelectron. Reliab., 2012)

Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. - Jung Han Kang; Edward Namkyu Cho; Ilgu Yun (Microelectron. Reliab., 2014)

An analytical avalanche breakdown model for double gate MOSFET. - Edward Namkyu Cho; Yong-Hyeon Shin; Ilgu Yun (Microelectron. Reliab., 2015)