Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. - Egas Henes Neto; Ivandro Ribeiro; Michele G. Vieira; Gilson I. Wirth; Fernanda Lima Kastensmidt (SBCCI, 2005)

Single event transients in combinatorial circuits. - Gilson I. Wirth; Michele G. Vieira; Egas Henes Neto; Fernanda Gusmão de Lima Kastensmidt (SBCCI, 2005)

Generation and Propagation of Single Event Transients in CMOS Circuits. - Gilson I. Wirth; Michele G. Vieira; Egas Henes Neto; Fernanda Gusmão de Lima Kastensmidt (DDECS, 2006)

Using Bulk Built-in Current Sensors to Detect Soft Errors. - Egas Henes Neto; Ivandro Ribeiro; Michele G. Vieira; Gilson I. Wirth; Fernanda Lima Kastensmidt (IEEE Micro, 2006)

Using built-in sensors to cope with long duration transient faults in future technologies. - Carlos Arthur Lang Lisbôa; Fernanda Lima Kastensmidt; Egas Henes Neto; Gilson I. Wirth; Luigi Carro (ITC, 2007)

A built-in current sensor for high speed soft errors detection robust to process and temperature variations. - Egas Henes Neto; Fernanda Lima Kastensmidt; Gilson I. Wirth (SBCCI, 2007)

Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. - Egas Henes Neto; Gilson I. Wirth; Fernanda Lima Kastensmidt (J. Electron. Test., 2008)

Modeling the sensitivity of CMOS circuits to radiation induced single event transients. - Gilson I. Wirth; Michele G. Vieira; Egas Henes Neto; Fernanda Lima Kastensmidt (Microelectron. Reliab., 2008)