Self-testing and self-checking combinational circuits with weakly independent outputs. - Egor S. Sogomonyan; Michael Gössel (VTS, 1992)

Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. - Egor S. Sogomonyan; Michael Gössel (DFT, 1993)

Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. - Michael Gössel; Egor S. Sogomonyan (VLSI, 1993)

Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. - Egor S. Sogomonyan; Michael Gössel (J. Electron. Test., 1993)

Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. - Michael Gössel; Egor S. Sogomonyan (VTS, 1994)

Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. - Egor S. Sogomonyan; Michael Gössel (VTS, 1996)

A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. - Michael Gössel; Egor S. Sogomonyan (J. Electron. Test., 1996)

Self-Checking Comparator with One Periodic Output. - Sandip Kundu; Egor S. Sogomonyan; Michael Gössel; Steffen Tarnick (IEEE Trans. Computers, 1996)

Code-Disjoint Circuits for Parity Circuits. - Hendrik Hartje; Michael Gössel; Egor S. Sogomonyan (Asian Test Symposium, 1997)

A linear code-preserving signature analyzer COPMISR. - Andrzej Hlawiczka; Michael Gössel; Egor S. Sogomonyan (VTS, 1997)

A Structural Approach for Space Compaction for Concurrent Checking and BIST. - Markus Seuring; Michael Gössel; Egor S. Sogomonyan (VTS, 1998)

Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. - Adit D. Singh; Egor S. Sogomonyan; Michael Gössel; Markus Seuring (ITC, 1999)

A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. - Michael Gössel; Andrej A. Morosov; Egor S. Sogomonyan (VTS, 1999)

A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. - Egor S. Sogomonyan; Adit D. Singh; Michael Gössel (J. Electron. Test., 1999)

A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. - Vitalij Ocheretnij; Egor S. Sogomonyan; Michael Gössel (Asian Test Symposium, 2001)

Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan (IOLTW, 2001)

Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. - Egor S. Sogomonyan; Andrej A. Morosov; Jan Rzeha; Michael Gössel; Adit D. Singh (VTS, 2001)

Partially Duplicated Code-Disjoint Carry-Skip Adder. - Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan (DFT, 2002)

A New Self-Checking Code-Disjoint Carry-Skip Adder. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (IOLTW, 2002)

Scan-Path with Directly Duplicated and Inverted Duplicated Registers. - Michael Gössel; Egor S. Sogomonyan; Adit D. Singh (VTS, 2002)

Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. - Kartik Mohanram; Egor S. Sogomonyan; Michael Gössel; Nur A. Touba (IOLTS, 2003)

A Modulo p Checked Self-Checking Carry Select Adder. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld (IOLTS, 2003)

Multimode scan: Test per clock BIST for IP cores. - Adit D. Singh; Markus Seuring; Michael Gössel; Egor S. Sogomonyan (ACM Trans. Design Autom. Electr. Syst., 2003)

Self-checking Carry-selectAdder with Sum-bit Duplication. - Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel (ARCS Workshops, 2004)

A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. - Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel (DATE, 2004)

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (ETS, 2004)

Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. - Vitalij Ocheretnij; Daniel Marienfeld; Egor S. Sogomonyan; Michael Gössel (IOLTS, 2004)

New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (Asian Test Symposium, 2005)

On-line Fault Detection and Location for NoC Interconnects. - Cristian Grecu; André Ivanov; Res Saleh; Egor S. Sogomonyan; Partha Pratim Pande (IOLTS, 2006)

A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (IOLTS, 2006)

Modulo p=3 Checking for a Carry Select Adder. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld (J. Electron. Test., 2006)

A Non-linear Split Error Detection Code. - Michael Gössel; Egor S. Sogomonyan (Fundam. Informaticae, 2008)

A new method for correcting time and soft errors in combinational circuits. - Egor S. Sogomonyan; Stefan Weidling; Michael Gössel (DDECS, 2013)

Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. - Stefan Weidling; Egor S. Sogomonyan; Michael Gössel (DSD, 2013)

Enhanced architectures for soft error detection and correction in combinational and sequential circuits. - Milos Krstic; Stefan Weidling; Vladimir Petrovic; Egor S. Sogomonyan (Microelectron. Reliab., 2016)

Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches. - Mehmed Dug; Stefan Weidling; Egor S. Sogomonyan; Dejan Jokic; Milos Krstic (J. Circuits Syst. Comput., 2020)