Scalable High Voltage CMOS technology for Smart Power and sensor applications. - Martin Schrems; Martin Knaipp; Hubert Enichlmair; Verena Vescoli; Rainer Minixhofer; Ehrenfried Seebacher; Friedrich Peter Leisenberger; Ewald Wachmann; Gregor Schatzberger; Heimo Gensinger (Elektrotech. Informationstechnik, 2008)

Interface traps density-of-states as a vital component for hot-carrier degradation modeling. - Stanislav Tyaginov; Ivan A. Starkov; Oliver Triebl; Johann Cervenka; C. Jungemann; Sara Carniello; Jong Mun Park; Hubert Enichlmair; Markus Karner; Ch. Kernstock; Ehrenfried Seebacher; Rainer Minixhofer; et al. (Microelectron. Reliab., 2010)

An analytical approach for physical modeling of hot-carrier induced degradation. - Stanislav Tyaginov; Ivan A. Starkov; Hubert Enichlmair; C. Jungemann; Jong Mun Park; Ehrenfried Seebacher; R. L. de Orio; Hajdin Ceric; Tibor Grasser (Microelectron. Reliab., 2011)

Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs. - Yasser Moursy; Hao Zou 002; Ramy Iskander; Pierre Tisserand; Dieu-My Ton; Giuseppe Pasetti; Ehrenfried Seebacher; Alexander Steinmair; Thomas Gneiting; Heidrun Alius (DATE, 2016)

Analysis of substrate currents propagation in HVCMOS technology. - Camillo Stefanucci; Pietro Buccella; Ehrenfried Seebacher; Alexander Steinmair; Maher Kayal; Jean-Michel Sallese (ESSDERC, 2016)

Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology. - Hao Zou 002; Yasser Moursy; Ramy Iskander; Alexander Steinmair; Heimo Gensinger; Ehrenfried Seebacher; Jean-Paul Chaput; Marie-Minerve Louërat (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits. - Mitiko Miura-Mattausch; Hidenori Miyamoto; Hideyuki Kikuchihara; Dondee Navarro; Tapas K. Maiti; Nezam Rohbani; C. Ma; Hans Jürgen Mattausch; A. Schiffmann; Alexander Steinmair; Ehrenfried Seebacher (ESSDERC, 2017)