Built-in self-test in a 24 bit floating point digital signal processor. - Narumi Sakashita; Hisako Sawai; Eiichi Teraoka; Toshiki Fugiyama; Toru Kengaku; Yukihiko Shimazu; Takeshi Tokuda (ITC, 1990)

A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. - Eiichi Teraoka; Toru Kengaku; Ikuo Yasui; Kazuyuki Ishikawa; Takahiro Matsuo; Hideyuki Wakada; Narumi Sakashita; Yukihiko Shimazu; Takeshi Tokuda (ITC, 1993)