A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. - Takashi Ohzone; Eiji Ishii; Takayuki Morishita; Kiyotaka Komoku; Toshihiro Matsuda; Hideyuki Iwata (IEICE Trans. Electron., 2007)

Moving surface mesh-incorporated particle method for numerical simulation of a liquid droplet. - Takuya Matsunaga; Seiichi Koshizuka; Tomoyuki Hosaka; Eiji Ishii (J. Comput. Phys., 2020)

Axisymmetric free-surface flow simulation using the moving surface mesh particle method and application to drop formation. - Takuya Matsunaga; Axel Södersten; Seiichi Koshizuka; Tomoyuki Hosaka; Eiji Ishii (J. Comput. Phys., 2022)