Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs. - Hajime Sasaki; Takayuki Hisaka; Kaoru Kadoiwa; Tomoki Oku; Shinobu Onoda; Takeshi Ohshima; Eiji Taguchi; Hidehiro Yasuda (Microelectron. Reliab., 2018)