16.7-fA/cell tunnel-leakage-suppressed 16-Mb SRAM for handling cosmic-ray-induced multierrors. - Kenichi Osada; Yoshikazu Saitoh; Eishi Ibe; Koichiro Ishibashi (IEEE J. Solid State Circuits, 2003)

Single Event Effects as a Reliability Issue of IT Infrastructure. - Eishi Ibe; Hideaki Kameyama; Yasuo Yahagi; Hironaru Yamaguchi (ICITA (1), 2005)

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling. - Eishi Ibe; S. S. Chung; ShiJie Wen; Hironaru Yamaguchi; Yasuo Yahagi; Hideaki Kameyama; Shigehisa Yamamoto; Takashi Akioka (CICC, 2006)

Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons. - Eishi Ibe; Tadanobu Toba; Ken-ichi Shimbo; Hitoshi Taniguchi (IOLTS, 2012)