Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. - Isaac Bruce; Michael Sekyere; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. - Michael Sekyere; Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. - Praise O. Farayola; Ekaniyere Oko-Odion; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Des. Test, 2023)

A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. - Isaac Bruce; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Matthew Crabb; Degang Chen 001 (ISVLSI, 2024)

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. - Ekaniyere Oko-Odion; Isaac Bruce; Emmanuel Nti Darko; Michael Sekyere; Degang Chen 001 (ISVLSI, 2024)

Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. - Isaac Bruce; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Matthew Crabb; Degang Chen 001 (MWSCAS, 2024)

Efficient Hybrid Resistor-String and Capacitor DAC with Area Efficient Redundancy-Based Digital Calibration for High-Performance Applications. - Ekaniyere Oko-Odion; Emmanuel Nti Darko; Isaac Bruce; Matthew Crabb; Degang Chen 001 (I2MTC, 2025)

A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity. - Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Saeid Karimpour; Kushagra Bhatheja; Degang Chen 001 (ISCAS, 2025)