Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs. - Anjela Yu. Matrosova; Ekaterina Loukovnikova; Sergei Ostanin; Alexandra Zinchuk; Ekaterina Nikolaeva (DFT, 2007)

PDFs testing of combinational circuits based on covering ROBDDs. - Anjela Yu. Matrosova; Ekaterina Nikolaeva (EWDTS, 2010)

PDF testability of the circuits derived by special covering ROBDDs with gates. - Anzhela Yu. Matrosova; Ekaterina Nikolaeva; Dmitry Kudin; Virendra Singh (EWDTS, 2013)

Combinational circuits without false paths. - Anzhela Yu. Matrosova; Dmitry Kudin; Ekaterina Nikolaeva (EWDTS, 2014)

Fault-tolerant high performance scheme design. - Anzhela Yu. Matrosova; Sergey Ostanin; Irina Kirienko; Ekaterina Nikolaeva (EWDTS, 2015)

A fault-tolerant sequential circuit design for SAFs and PDFs soft errors. - Anzhela Yu. Matrosova; Sergey Ostanin; Irina Kirienko; Ekaterina Nikolaeva (IOLTS, 2016)

Detection and masking of Trojan Circuits in sequential logic. - Anzhela Yu. Matrosova; Eugeniy Mitrofanov; Sergey Ostanin; Ekaterina Nikolaeva (EWDTS, 2017)

Masking Internal Node Faults and Trojan Circuits in Logical Circuits. - Anzhela Yu. Matrosova; V. Provkin; Ekaterina Nikolaeva (EWDTS, 2019)

Constructing a Sequence Detecting Robustly Testable Path Delay Faults in Sequential Circuits. - Anzhela Yu. Matrosova; Semen Chernyshov; O. Kh. Kim; Ekaterina Nikolaeva (Autom. Remote. Control., 2021)