Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs. - Christoforos G. Theodorou; Eleftherios G. Ioannidis; Sébastien Haendler; Nicolas Planes; Franck Arnaud; Jalal Jomaah; Charalambos A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2012)

Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. - Eleftherios G. Ioannidis; Sébastien Haendler; Christoforos G. Theodorou; Nicolas Planes; Charalabos A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2014)

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs. - Christoforos G. Theodorou; Eleftherios G. Ioannidis; Sébastien Haendler; Nicolas Planes; Emmanuel Josse; Charalambos A. Dimitriadis; Gérard Ghibaudo (IRPS, 2015)