Breakdown fields and conduction mechanisms in thin Ta2O5 layers on Si for high density DRAMs. - Elena Atanassova; Albena Paskaleva (Microelectron. Reliab., 2002)

Thermal Ta2O5–alternative to SiO2 for storage capacitor application. - Elena Atanassova; Dejan Spasov (Microelectron. Reliab., 2002)

Electrical properties of thin RF sputtered Ta2O5 films after constant current stress. - M. Pecovska-Gjorgjevich; Nenad Novkovski; Elena Atanassova (Microelectron. Reliab., 2003)

Effect of microwave radiation on the properties of Ta2O5-Si microstructures. - Elena Atanassova; Raisa V. Konakova; Vadym Fedorovych Mitin; J. Koprinarova; O. S. Lytvym; O. B. Okhrimenko; V. V. Schinkarenko; D. Virovska (Microelectron. Reliab., 2005)

Challenges of Ta2O5 as high-k dielectric for nanoscale DRAMs. - Elena Atanassova; Albena Paskaleva (Microelectron. Reliab., 2007)

Metal gates and gate-deposition-induced defects in Ta2O5 stack capacitors. - Elena Atanassova; Dencho Spassov; Albena Paskaleva (Microelectron. Reliab., 2007)

Effects of the metal gate on the stress-induced traps in Ta2O5/SiO2 stacks. - Elena Atanassova; Albena Paskaleva; Nenad Novkovski (Microelectron. Reliab., 2008)

Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode. - Elena Atanassova; Ninoslav Stojadinovic; Albena Paskaleva (Microelectron. Reliab., 2008)

Constant current stress-induced leakage current in mixed HfO2-Ta2O5 stacks. - Elena Atanassova; Nenad Novkovski; Albena Paskaleva; Dencho Spassov (Microelectron. Reliab., 2010)

Lightly Al-doped Ta2O5: Electrical properties and mechanisms of conductivity. - Dencho Spassov; Elena Atanassova; Albena Paskaleva (Microelectron. Reliab., 2011)

Doped Ta2O5 and mixed HfO2-Ta2O5 films for dynamic memories applications at the nanoscale. - Elena Atanassova; Albena Paskaleva; Dencho Spassov (Microelectron. Reliab., 2012)

Time-dependent-dielectric-breakdown characteristics of Hf-doped Ta2O5/SiO2 stack. - Elena Atanassova; Nenad Novkovski; Dencho Spassov; Albena Paskaleva; Aleksandar Skeparovski (Microelectron. Reliab., 2014)