Thermally stable, packaged aware LV HKMG platforms benchmark to enable low power I/O for next 3D NAND generations. - Alessio Spessot; Shairfe Muhammad Salahuddin; Ricardo Escobar; Romain Ritzenthaler; Yang Xiang; Rahul Budhwani; Eugenio Dentoni Litta; Elena Capogreco; Joao P. Bastos; Yangyin Chen; Naoto Horiguchi (IMW, 2022)

Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery. - J. P. Bastos; Barry J. O'Sullivan; Jacopo Franco; Stanislav Tyaginov; Brecht Truijen; Adrian Vaisman Chasin; Robin Degraeve; Ben Kaczer; Romain Ritzenthaler; Elena Capogreco; E. Dentoni Litta; Alessio Spessot; et al. (IRPS, 2022)

High Performance Thermally Resistant FinFETs DRAM Peripheral CMOS FinFETs with VTH Tunability for Future Memories. - Romain Ritzenthaler; Elena Capogreco; E. Dupuy; Hiroaki Arimura; J. P. Bastos; P. Favia; F. Sebaai; D. Radisic; V. T. H. Nguyen; G. Mannaert; B. T. Chan; V. Machkaoutsan; et al. (VLSI Technology and Circuits, 2022)

Side and Corner Region Non-Uniformities in Grown SiO2 and Their Implications on Current, Capacitance and Breakdown Characteristics. - J. P. Bastos; Barry J. O'Sullivan; Yusuke Higashi; Adrian Vaisman Chasin; Jacopo Franco; Hiroaki Arimura; J. Ganguly; Elena Capogreco; Alessio Spessot; N. Horiguchi (IRPS, 2024)

DRAM-Peri FinFET - A Thermally-Stable High-Performance Advanced CMOS RMG Platform with Mo-Based pWFM for sub-10nm DRAM. - J. Ganguly; Hiroaki Arimura; Romain Ritzenthaler; H. Bana; J. W. Maes; J. G. Lai; S. Brus; W. Maqsood; R. Sarkar; B. Kannan; Elena Capogreco; V. Machkaoutsan; et al. (VLSI Technology and Circuits, 2024)