Resistive switching synapses for unsupervised learning in feed-forward and recurrent neural networks. - Valerio Milo; Giacomo Pedretti; Mario Laudato; Alessandro Bricalli; Elia Ambrosi; Stefano Bianchi; Elisabetta Chicca; Daniele Ielmini (ISCAS, 2018)

In-memory solution of linear systems with crosspoint arrays without iterations. - Zhong Sun; Giacomo Pedretti; Elia Ambrosi; Alessandro Bricalli; Wei Wang 209; Daniele Ielmini (DRC, 2019)

Joule Heating in SiOx RRAM Device Studied by an Integrated Micro-Thermal Stage. - Nicola Polino; Mario Laudato; Elia Ambrosi; Alessandro Bricalli; Daniele Ielmini (ESSDERC, 2019)

A Volatile RRAM Synapse for Neuromorphic Computing. - Erika Covi; Daniele Ielmini; Y.-H. Lin; Wei Wang 209; Tommaso Stecconi; Valerio Milo; Alessandro Bricalli; Elia Ambrosi; Giacomo Pedretti; Tseung-Yuen Tseng (ICECS, 2019)

In-memory PageRank using a Crosspoint Array of Resistive Switching Memory (RRAM) devices. - Zhong Sun; Giacomo Pedretti; Elia Ambrosi; Alessandro Bricalli; Daniele Ielmini (AICAS, 2020)

In-Memory Eigenvector Computation in Time O (1). - Zhong Sun; Giacomo Pedretti; Elia Ambrosi; Alessandro Bricalli; Daniele Ielmini (Adv. Intell. Syst., 2020)

Time complexity of in-memory solution of linear systems. - Zhong Sun; Giacomo Pedretti; Piergiulio Mannocci; Elia Ambrosi; Alessandro Bricalli; Daniele Ielmini (CoRR, 2020)

Characterization of resistive switching devices for memory and computing. - Elia Ambrosi (2020)

Conductance variations and their impact on the precision of in-memory computing with resistive switching memory (RRAM). - Giacomo Pedretti; Elia Ambrosi; Daniele Ielmini (IRPS, 2021)

Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. - P. C. Chang; P. J. Liao; D. W. Heh; C. Lee; D. H. Hou; Elia Ambrosi; C. H. Wu; H. Y. Lee; J. H. Lee; Xinyu Bao (IRPS, 2022)

First Fire-free, Low-voltage ( 1.2 V), and Low Off-current ( 3 nA) SiOxTey Selectors. - S. Vaziri; I. M. Datye; Elia Ambrosi; Asir Intisar Khan; H. Kwon; C. H. Wu; C. F. Hsu; J. Guy; T. Y. Lee; H.-S. Philip Wong; X. Y. Bao (VLSI Technology and Circuits, 2022)

A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. - P. C. Chang; P. J. Liao; C. H. Wu; Y. C. Chang; D. H. Hou; Elia Ambrosi; H. Y. Lee; J. H. Lee; X. Y. Bao (IRPS, 2023)