Reducing Scan Shift Power at RTL. - Elif Alpaslan; Yu Huang 005; Xijiang Lin; Wu-Tung Cheng; Jennifer Dworak (VTS, 2008)

NIM- a noise index model to estimate delay discrepancies between silicon and simulation. - Elif Alpaslan; Jennifer Dworak; Bram Kruseman; Ananta K. Majhi; Wilmar M. Heuvelman; Paul van de Wiel (DATE, 2010)

On Reducing Scan Shift Activity at RTL. - Elif Alpaslan; Yu Huang 005; Xijiang Lin; Wu-Tung Cheng; Jennifer Dworak (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. - Elif Alpaslan; Bram Kruseman; Ananta K. Majhi; Wilmar M. Heuvelman; Jennifer Dworak (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)