A Reconfigurable Built-In Self-Repair Scheme for Multiple Repairable RAMs in SOCs. - Tsu-Wei Tseng; Jin-Fu Li 001; Chih-Chiang Hsu; Alex Pao; Kevin Chiu; Eliot Chen (ITC, 2006)

A Built-In Self-Repair Scheme for Multiport RAMs. - Tsu-Wei Tseng; Chun-Hsien Wu; Yu-Jen Huang; Jin-Fu Li 001; Alex Pao; Kevin Chiu; Eliot Chen (VTS, 2007)

Refined High Resistance Baking Approaches for Optimal Interconnect Reliability. - H. C. Chang; Eliot Chen; P. J. Liao; J. H. Lee; Ryan Lu; Y. K. Hwang (IRPS, 2025)

Comprehensive Study of Non-Conducting Stress Characteristics in Ultra-Scaled FinFET. - Jun-Yu Huang; Clement Huang; Kun-Chung Huang; Da-You Yang; Hsin-Jou Chuang; Yi-Wen Lee; Eliot Chen; Jen-Hao Lee; Ryan Lu (IRPS, 2025)