Elisa Sacco
Orcid: 0000-0002-0775-5815
According to our database1,
Elisa Sacco
authored at least 14 papers
between 2017 and 2022.
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Bibliography
2022
Methodology for Readout and Ring Oscillator Optimization Toward Energy-Efficient VCO-Based ADCs.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022
A 96.9-dB-Resolution 109-μW Second-Order Robust Closed-Loop VCO-Based Sensor Interface for Multiplexed Single-Ended Resistance Readout in 180-nm CMOS.
IEEE J. Solid State Circuits, 2022
2020
A 16.1-bit Resolution 0.064-mm<sup>2</sup> Compact Highly Digital Closed-Loop Single-VCO-Based 1-1 Sturdy-MASH Resistance-to-Digital Converter With High Robustness in 180-nm CMOS.
IEEE J. Solid State Circuits, 2020
Improving the EMI Robustness of Feedback-based Time-Encoding Readout Architectures for Resistive Sensor Interfaces.
Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020
2019
Performance Limitation Analysis of Highly-Digital Time-Based Closed-Loop Sensor-to-Digital Converter Architectures.
IEEE Trans. Circuits Syst. II Express Briefs, 2019
A Robust BBPLL-Based 0.18- $\mu$ m CMOS Resistive Sensor Interface With High Drift Resilience Over a -40 °C-175 °C Temperature Range.
IEEE J. Solid State Circuits, 2019
Architectural Analysis of a Novel Closed-Loop VCO-Based 1-1 Sturdy MASH Sensor-to-Digital Converter.
Proceedings of the 16th International Conference on Synthesis, 2019
From Open-Loop to Closed-Loop Single-VCO-Based Sensor-to-Digital Converter Architectures: theoretical analysis and comparison.
Proceedings of the IEEE 8th International Workshop on Advances in Sensors and Interfaces, 2019
A 16.1-b ENOB 0.064mm<sup>2</sup> Compact Highly-Digital Closed-Loop Single-VCO-based 1-1 SMASH Resistance-to-Digital Converter in 180nm CMOS.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2019
2018
Controlled-Oscillator Optimization for Highly-Digital CMOS Time-Based Sensor-to-Digital Converter Architectures.
Proceedings of the 15th International Conference on Synthesis, 2018
Improving the robustness and drift resilience of CMOS BBPLL-based time-based sensor interfaces.
Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018
A Single-Temperature-Calibration 0.18-µm CMOS Time-Based Resistive Sensor Interface with Low Drift over a -40°C to 175°C Temperature Range.
Proceedings of the 44th IEEE European Solid State Circuits Conference, 2018
2017
Analysis and modeling of drift-resilient time-based integrated resistive sensor interfaces.
Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces, 2017
Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces, 2017