Advanced automatic test pattern generation and redundancy identification techniques. - Michael H. Schulz; Elisabeth Auth (FTCS, 1988)

Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. - Michael H. Schulz; Elisabeth Auth (ITC, 1989)

Improved deterministic test pattern generation with applications to redundancy identification. - Michael H. Schulz; Elisabeth Auth (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989)

A Test-Pattern-Generation Algorithm for Sequential Circuits. - Elisabeth Auth; Michael H. Schulz (IEEE Des. Test Comput., 1991)

Automatische Testmustergenerierung in synchronen sequentiellen Schaltungen. - Elisabeth Auth (VDI-Verlag, 1992)