Review of fuse and antifuse solutions for advanced standard CMOS technologies. - Elodie Ebrard; Bruno Allard; Philippe Candelier; Patrice Waltz (Microelectron. J., 2009)

Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications. - D. Lipp; Z. Zhao; G. Krause; Wafa Arfaoui; Elodie Ebrard; Germain Bossu; S. Evseev; Markus Herklotz; Mahesh Siddabathula (IRPS, 2023)