Random telegraph signal noise in tunneling field-effect transistors with S below 60 mV/decade. - Markus Hellenbrand; Elvedin Memisevic; Johannes Svensson; Erik Lind; Lars-Erik Wernersson (ESSDERC, 2017)

Effect of Gate Oxide Defects on Tunnel Transistor RF Performance. - Markus Hellenbrand; Elvedin Memisevic; Johannes Svensson; A. Krishnaraja; Erik Lind; Lars-Erik Wernersson (DRC, 2018)